Nanoscale thermal imaging of VO<sub>2</sub> via Poole–Frenkel conduction
نویسندگان
چکیده
We present a method for nanoscale thermal imaging of insulating thin films using atomic force microscopy (AFM), and we demonstrate its utility on VO 2 . sweep the applied voltage V to conducting AFM tip in contact mode measure local current I through film. By fitting IV curves Poole–Frenkel conduction model at low V, calculate temperature with spatial resolution better than 50 nm only fundamental constants known film properties. Our thermometry technique enables measurement any dominated by mechanism can be extended insulators that display other mechanisms.
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2022
ISSN: ['1520-8842', '0003-6951', '1077-3118']
DOI: https://doi.org/10.1063/5.0086932